摘要
本文描述在X光激光实验中用平晶谱仪测量类Ne锗离子L带线谱,首次借助于碰撞辐射模型,用L带特征线的强度所确定等离子体电子密度和温度。并用平晶谱仪配条纹相机测量等离子体的时间特性。
A flat-crystal spectrograph was used to measure the Ne-like Ge ion L-shell line spectra in X-ray laser experiments.By means of a collisional-radiation model, the electron density and temperature of laser produced plasma were obtained from the intensity ratios of L-shell lines. In addition, some temporal features of the plasma were studied.
出处
《核聚变与等离子体物理》
CAS
CSCD
北大核心
1992年第2期105-110,共6页
Nuclear Fusion and Plasma Physics
关键词
X光激光
L带线谱
等离子体
X-ray laser, L-shell line, Reflecting mirror.
