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基于复用的SOC测试技术 被引量：3

SOC testing based on reuse
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摘要 复用不仅是SOC设计思想的核心,也是解决SOC测试的基础。本文在分析SOC的基本概念和特点的基础上,从复用的角度对现有的SOC测试方案进行分析和综述,并探讨了亟待解决的问题。 SOC is increasingly designed by embedding reusable cores. A reuse-based teststrategy for such ICs is often attractive and sometimes even mandatory. Main kinds of SOC teststrategies are analyzed and surveyed from the reuse point. Finally, we discuss the issues remain tobe resolved.
作者 王红 邢建辉 杨士元
机构地区 清华大学自动化系
出处 《半导体技术》 CAS CSCD 北大核心 2004年第5期49-51,共3页 Semiconductor Technology
基金 国家自然科学基金重大项目(90207016)
关键词 芯片上系统 测试 SOC 集成电路 复用技术 SOC test reuse
分类号 TN407 [电子电信—微电子学与固体电子学]
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参考文献17

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同被引文献28

  • 1熊志辉,李思昆,陈吉华,王海力,边计年.一种基于层次平台的SoC系统设计方法[J].电子学报,2004,32(11):1815-1819. 被引量：9
  • 2胡瑜,韩银和,李晓维.SOC可测试性设计与测试技术[J].计算机研究与发展,2005,42(1):153-162. 被引量：42
  • 3CHARLESR.KIME,KEWALK.SALUJA,矫美.数字系统的内装自测试[J].计算机与数字工程,1996,24(2):43-57. 被引量：2
  • 4陈光禹.数据域测试及仪器[M].成都:电子科技大学出版社,2001..
  • 5Hellebrand S,Rajski J,Tarnick S,et al.Builtin test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers[J].IEEE Trans on Computers,1995,44(2):223-233.
  • 6Al-Yamani A A,McCluskey E J.Seeding encoding with LFSRs and cellular automata[J].IEEE Trans on Computers,2003,33(3):560-565.
  • 7Krishna C V,Jas A,Touba A N.Test vector encoding using partial LFSR reseeding[A].Proceedings of the IEEE International Test Conference[C],2001:885-893.
  • 8Liang H G,Jiang C Y.Sharing BIST with multiple cores for system-on-a-chip[A].12th Asian Test Symposium[C],2003:418-423.
  • 9Yamani S,Mitra S,McCluskey E J.BIST reseeding with very few seeds[A].21st IEEE VLSI Test Symposium[C],2003,2A(4):69-74.
  • 10S Sarkar, S Chandar G,S Shinde. Effective IP reuse for high quality SOC design [ A ]. Proceedings of IEEE International SOC Conference[ C]. Washington DC: IEEE Computer Soci- ety,2005.217 - 224.

引证文献3

二级引证文献21

半导体技术
2004年 第5期

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