摘要
报道一种测量微小光学相位延迟的新方法,测定装置简单而且精度高,用于测量PLZT等薄膜材料的克尔系数。
This paper reports a new method to measure small optical phase dclay. The methodhas the merits of high accuracy and simplicity of measuring system. It can be used to measureKerr coefficient of thin films such as PLZT and evaluate their electro-optic effect.
出处
《应用激光》
CSCD
北大核心
1992年第2期77-78,66,共3页
Applied Laser
