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相位误差对AWG波分复用器非相邻通道串扰影响的分析

Analysis of Non-Adjacent Channel Crosstalk Level of AWG Device Induced by Random Phase Errors
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摘要 分析了工艺制作过程中引入的阵列波导相位误差以及由其所引起的非相邻通道间串扰性能的劣化 ,给出了相应的分析公式 .利用该公式 ,可以简捷地分析所设计的 AWG型器件的非相邻通道串扰水平 ,为优化 AWG型器件的设计提供依据 . Random phase errors of array waveguides induced by fabrication processing and their affects on crosstalk level of AWG based DWDM demultiplexer between non-adjacent channels are analyzed.A useful formula which can be used to estimate the crosstalk level of AWG devices is given.Using this formula,AWG based DWDM components can be optimized in order to reduce their crosstalk level.
作者 李蔚 刘德明 黄德修
机构地区 华中科技大学光电子工程系
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2003年第12期1293-1296,共4页 半导体学报（英文版）
关键词 阵列波导光栅 波分复用解复用器 串扰 相位误差 非相邻通道 光波导 array waveguide grating demultiplexer crosstalk
分类号 TN252 [电子电信—物理电子学]
  • 相关文献

参考文献8

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二级参考文献25

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共引文献2

Journal of Semiconductors
2003年 第12期

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