摘要
介绍了一种L、C、R测试系统,可以在75kHz～30MHz频率范围内对元器件进行精密测量。阐述了测试系统中的关键技术:包括自动平衡电桥法阻抗测量技术、75kHz～30MHz频率合成源技术、自动电平控制技术、鉴相及矢量测量技术、A D变换技术和四端对结构。研究了测试系统的误差来源及消除误差的方法,给出了系统的校准件的数学模型,并据此模型对系统的分布参量误差、频响误差等进行测量校准。最后给出了实验结果,系统的准确度为0 1%,被测件DUT上所加信号频率为75kHz～30MHz,以100Hz步进,幅度在5mV～2V范围内连续可调。
A kind of LCR test system is introduced. This system can test the performance (resistance, inductance, capacitance) of a device in the frequency range of 75 kHz～30 MHz. The key technology in the system is described, including the technologies of testing impedance using autobalance bridge, 75 kHz～30 MHz frequency synthesis, automatic level control, phasic detection and vector measurement, A/D transforming, and fourterminal pair. The test error sourses and the method for reducing errors have been studied. A mathematical model of the calibrator is given. The experiment results show that the basic precision of this test set is 01%, the frequency range is 75 kHz～30 MHz and the level range is 5 mV～2 V.
出处
《计量学报》
CSCD
北大核心
2003年第4期330-333,共4页
Acta Metrologica Sinica
基金
信息产业部电子科学研究院基金
关键词
计量学
阻抗测量
自动平衡电桥
电平控制
四端对
Metrology
Impedance measurement
Autobalancing bridge
Automatic level control
Four-terminal pair
