摘要
简要介绍了X射线衍射形貌术实验技术及北京同步辐射实验室形貌站的实验技术。通过举例,扼要叙述了同步辐射X射线形貌术在宝石级晶体缺陷研究中的应用。
The basic diffraction topographic techniques are introduced in brief, while the Xray topography station at the Beijing Synchrotron Radiation Facilities is also introduced. The applications of the synchrotron radiation Xray topography on the studies of gemstone defects are briefly described by illustration of several examples.
出处
《宝石和宝石学杂志》
CAS
2003年第3期15-18,共4页
Journal of Gems & Gemmology
关键词
同步辐射
X射线形貌术
晶体缺陷
synchrotron radiation
X-ray topography
crystal defect
