摘要
小麦黄矮病是由大麦黄矮病毒(BYDV)引起的小麦主要病害之一。本文综述了小麦BYDV的主要抗性基因及其鉴定方法、微克隆和微分离的研究进展,并对其形态学标记、生化标记、细胞学分析和分子标记鉴定方法的原理及应用作了比较分析。本文最后还提出了目前研究中存在的问题及其未来研究的方向。
Wheat yellow dwarf, one of the major diseases in wheat was caused by Barley Yellow Dwarf Virus (BYDV). The research progress of the BYDV resistant genes used in wheat and their dissection, cloning and identification methods were summarized. The theories and applications of morphological markers, biochemical markers, cytological analysis and molecular markers identifications were also comparatively analyzed. The problems at present and the thing which should be done in future were discussed.
出处
《麦类作物学报》
CAS
CSCD
2003年第3期123-127,共5页
Journal of Triticeae Crops
基金
国家自然科学基金(30070465)
关键词
小麦
黄矮病
抗性基因
鉴定
微克隆
微分离
大麦黄矮病毒
Wheat yellow dwarf
Identification of resistant genes
BYDV
Microdissection
Microcloning
