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苯甲酰胺与电子束复合处理对大豆的损伤效应 被引量:5

Complex Treatment Of Benzamidc With Electron Demaging Soybean
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摘要 应用电子束和苯甲酰胺单因子和复因子处理大豆风干种子的结果表明:苯甲酰胺单因子处理,对大豆M_1代的苗高、成株率、孕性和根尖细胞染色体畸变频率均未产生明显影响,即苯甲酰胺本身无药效反应;苯甲酰胺和电子束复因子处理较电子束单因子处理的苗高、成株率和孕性明显降低,根尖细胞染色体畸变频率明显增加,即苯甲酰胺能够增强电子束的损伤效应。 The results of by using independent treatments and complex treatment of electron and benza-mide to natural dryed soybean seeds is following:The height of seedling of M1 , rare of growing to mature paint, character of booting and frequence of chromosome aberration in cells of root have not been clearly affected by independent treatment of benzamide. It showed that soybean has not response to benzamide. The height of seedling of M1, rate of growing to mature plant, characterof booting and frenquence of chromosome aberration in cells of root by complex treatment of ben-zamide with electron droped more obviously than by independent treatment of electron.
机构地区 吉林农业大学
出处 《吉林农业大学学报》 CAS CSCD 1992年第3期38-41,共4页 Journal of Jilin Agricultural University
基金 省科委基础研究资助项目
关键词 损伤效应 苯甲酰胺 大豆 电子束 benzamide, soybean, electron
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