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电子束对大麦的诱变效应研究互Ⅰ.对M_1和M_2的效应 被引量:7

STUDIES ON THE MUTAGENIC EFFECT OF THE ELECTRON BEAM IN BARLEY (HORDEUM VULGARE L.) Ⅰ.THE EFFECTS ON M_1 AND M_2 GENERATIONS
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摘要 采用100—300Gy辐照处理13个大麦品种(系)的风干种子,M1代产生明显的生物学辐射损伤,表现在苗的高度降低,第一叶片长度和根的长度变短,植物存活率和结实率下降。电子束诱变的适宜剂量一般为100—200Gy,在此剂量范围内,M2代突变频率为0.276%-3.84%,除出现多种叶绿素缺陷突变外,还出现植株生长习性、株高、叶型、穗型、穗长,芒型、早熟性及茎叶蜡质减少等形态或生理性状突变,表现电子束对大麦具有诱变类型丰富、突变谱广的特点。同一种诱变处理的M1结实率高低的不同类型还会影响到M2形态突变的类型。 The dry seeds of 13 barley cultivars (strains) were irradiated by electron beam with expose doses of 100--300 Gy. The obviously biological damages,such as decreasing of seeding length, the length of first leaf, root length, surviving plant rate and fertility rate were observed in M1. The appropriate expose dose of electron beam for dry barley seeds was 100--200 Gy. The mutation frequence in M2 was 0.276%--3.849% at 100--200 Gy. Besides various mutants of chlorophyll defect a lot of mutants of morphological or physiological characters were obtained, such as height of plant, leaf type, ear type, ear lenght, awn type, ripe date, sterility and eceriferum It was showed that electron beam is one of valuable mutagenic sourses in mutation breeding. The result also showed that the different fertility rate in M1 treated with same dose could effect morpholoical mutation types in M2.
出处 《辐射研究与辐射工艺学报》 CAS CSCD 北大核心 1995年第1期33-37,共5页 Journal of Radiation Research and Radiation Processing
基金 中国科学院"八五"重大专题 上海市自然科学资助基金
关键词 电子束 辐照育种 大麦 诱变效应 Electron beam Barley Surviving plant rate Fertility Mutation spectrum
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参考文献5

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