摘要
针对集成电路故障测试集最小化问题的具体特点,利用混沌序列来控制搜索过程变量的变化规则,并引入对同一测试矢量所能覆盖的故障同时更新的特殊机制,提出了一种基于混沌搜索的测试集最小化方法,该方法具有很好的全局搜索能力。实验结果验证了该方法的高效性与实用性。
An optimization method based on chaotic searching is proposed for fault test set of integrate circuits.In this method,the rule of searching is controlled by several chaotic series and a special update scheme for test vectors in the test set is devel-oped.The method has a globally searching ability.The experi-ment results demonstrate the effectiveness and practicability of the method.
出处
《微电子学与计算机》
CSCD
北大核心
2003年第4期63-65,共3页
Microelectronics & Computer
