摘要
本文报道用扫描隧道显微镜(STM)在空气中观测淀积在100nm厚的CaF_2薄膜上的Al-Al_2O_3-Au发光隧道结表面的研究成果.在观测中首次发现结表面呈现出横向相关长度分别为30～70nm和3～5nm的两种粗糙度;横向相关长度小的粗糙度被横向相关长度大的所调制.这种横向相关长度为3～5nm的表面粗糙度的存在与Laks和Mills预期的表面随机粗糙隧道结发光理论值一致.
We report a study of the surface of Al-Al2O3-Au light-emitting junctions deposited on CaF2 underlayers of 100 nm thickness with scanning tunnelling micos-copy (STM) in air. For the first time, two kinds of the noughness on the junction surface are obserned, which have the transverse correlation length of 30-70nm and 3-5nm, respectively. The smaller one is modulated by the larger one. The existanoe of this surface roughness with the transverse correlation length of 3-5 nm is in agreement with the theoretical predication of Lake and Mills[2],
出处
《光学学报》
EI
CAS
CSCD
北大核心
1992年第1期78-82,共5页
Acta Optica Sinica
基金
国家自然科学基金会的资助
关键词
发光
隧道结
表面粗糙度
SPP
STM
Light-emitting tunnel junction, surface plasmon-polarition, surface noughness.
