摘要
本文根据测量的统计误差理论,对XRFS分析中不同背景和基体校正方式下的检出限述一进行讨论并导出了相应的计算公式,所得结论可作为选择微量元素XRFS分析的背景和基体校正方法以及拟定最佳实验条件以获得最低检出限的理论依据。
Discussions have been made for the detection limits (DL) of X-ray flourescence analysis and formulas for DL calculation have been derived from the statistic error theory of intensity measurements in various correction methods of backgrounds and matrix effects. The conclusions from this paper could be used as the roles for selection of background and matrix correction methods and optimization of experiment conditions for the purpose of the lowest DL.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1992年第4期93-96,共4页
Spectroscopy and Spectral Analysis
关键词
XRFS
检出限
计算公式
X-ray Fluorescent Spectrometry Detection limit Calculation formula
