摘要
有机发光二极管(OLED)显示器极易受到恶劣环境条件的影响。在户外发现,如暴露在阳光直射、紫外线辐射和高温储存等环境下,会导致亮度和寿命损失、像素收缩以及面板的永久性损坏等故障。本文采用不同阴极单元制造了红磷光OLED(TEOLED),在紫外线(365,20W)加速老化测试中,采用20W/m^(2)、30W/m^(2)、50W/m^(2)的紫外功率密度,对不同OLED阴极单元材料进行紫外线照射得到发光强度随时间变化的衰减曲线。探究不同紫外线照射功率密度下OLED屏幕发出亮度衰减率,采用拉伸指数衰减(SED)模型,使用其他测试数据来校正上述函数,结合扩展指数衰减模型进行数据拟合,构建紫外线强照射下不同OLED阴极单元材料随时间的亮度衰减模型,预测出不同阴极材料单元在紫外线照射下的预期寿命。
Organic Light-Emitting Diode(OLED)displays are highly susceptible to harsh environmental conditions.Outdoor exposure such as direct sunlight,ultraviolet(UV)radiation,and high-temperature storage can lead to luminance loss,reduced lifespan,pixel shrinkage,and permanent damage or failure of the panels.In this study,red phosphorescent OLEDs(TEOLEDs)with different cathode units were made.Accelerated aging tests under UV irradiation(365 nm,20 W)conducted using UV power densities of 20,30,and 50 W/m2 to obtain luminance intensity decay curves over time for various OLED cathode materials.The brightness decay rates of OLED screens under different UV irradiation intensities were investigated using a stretched exponential decay(SED)model.Other experimental data were used to calibrate the model,and an extended exponential decay model was integrated for data fitting.This approach establishes a time-dependent brightness decay model for different OLED cathode materials under UV irradiation,enabling the prediction of expected lifespans for cathode material units under UV exposure.
作者
胡湛晗
Hu Zhanhan(School of Computer Science and Engineering,North China Institute of Aerospace Engineering,Langfang 065000,China)
出处
《北华航天工业学院学报》
2025年第5期18-20,共3页
Journal of North China Institute of Aerospace Engineering
基金
河北省教育厅科学研究项目资助(QN2025375)。
