摘要
用电感耦合等离子体发射光谱法(Electron-coupled Plasma Atomic Emission Spectrometry,ICP-AES)快速测定镁锭中硅含量的分析方法。通过优化样品前处理、仪器工作参数及分析谱线选择,实现了硅元素的高灵敏度检测。实验表明,方法在250.690 nm处有良好的线性关系(R2> 0.999),检出限为0.0006%,测定下限为0.002%,相对标准偏差(Relative standard deviation,RSD)小于4%(n=7),加标回收率为95.3%~102.0%。该方法操作简便、准确度高,适用于镁锭中微量硅的快速检测,为镁合金生产工艺的质量控制提供了可靠的技术支持。
A method for rapid determination of silicon content in magnesium ingots was developed using inductively coupled plasma atomic emission spectroscopy(ICP-AES).By optimizing sample pretreatment,instrument parameters,and analytical spectral line selection,high-sensitivity detection of silicon was achieved.Experimental results demonstrated a strong linear relationship at 250.690 nm(R2>0.999),with a detection limit of 0.021μg/mL and a quantification limit of 0.069μg/mL.The relative standard deviation(RSD)was less than 4%(n=7),and spiked recoveries ranged from 95.3%to 102.0%.This method is simple,accurate,and suitable for rapid detection of trace silicon in magnesium ingots,providing reliable technical support for quality control in magnesium alloy production.
作者
施怡帆
Shi Yifan(Shanghai Zhongchu Materials Inspection Co.,Ltd.,Shanghai,201900)
出处
《当代化工研究》
2025年第9期63-65,共3页
Modern Chemical Research
关键词
电感耦合等离子体发射光谱法(ICP-AES)
镁锭
硅含量
定量分析
基体干扰
分析谱线
inductively coupled plasma atomic emission spectroscopy(ICP-AES)
magnesium ingot
silicon content
quantitative analysis
matrix interference
analytical spectral line
