摘要
随着集成电路特征尺寸的逐步缩小,随之而来快速增长的软错误率严重限制了现代微处理器的应用,因此对微处理器可靠性进行评估十分重要。在微处理器体系结构级进行软错误易感性评估能反映出微处理器部件的可靠性,提出基于Simple Sim-ARM模拟器对微处理器体系结构级进行软错误易感性评估的方法,可用于对ARM体系结构微处理器进行软错误易感性评估。根据提出方法对Strong ARM SA-11xx进行软错误易感性分析,实验结果表明,在基准配置情况下,存储部件中寄存器文件的平均AVF值为57.76%;非存储部件发射队列(IQ)、保留站与重定序缓冲(RUU)与功能单元(FU)的平均AVF值分别为38.53%、32.02%和12.39%。在不同配置下,IQ和RUU部件容量越大,对应部件AVF评估值越小;FU数量越多,该部件AVF评估值越小。
With the continuous shrinkage of feature size of integrated circuits,the increasing soft error rates seriously restrict the applications of modern microprocessors,making it very important to evaluate the reliability of microprocessors.A soft error vulnerability of microprocessor’s structures can reflect the reliability of structures.This paper proposed an architectural level soft error vulnerability analysis method based on the SimpleSim-ARM for ARM microprocessors.Using the method to analyze the soft error vulnerability of StrongARM SA-11 xx,the experimental results show when choosing the defined configuration,the average AVF values of the register files,issue queue(IQ),reservation station and reorder buffer(RUU)and function units(FU)are 57.76%,38.53%,32.02%and 12.39%,respectively.In different configurations,the larger the IQ and RUU component capacity,the smaller the AVF evaluation value.The larger the number of FU,the smaller the AVF evaluation value.
作者
高苗
虞致国
魏敬和
顾晓峰
Gao Miao;Yu Zhiguo;Wei Jinghe;Gu Xiaofeng(Engineering Research Center of Internet of Things Technology Applications,Ministry of Education,Dept.of Electronic Engineering,Jiangnan University,Wuxi Jiangsu 214122,China;China Electronic Technology Group Corporation No.58 Research Institute,Wuxi Jiangsu 214035,China)
出处
《计算机应用研究》
CSCD
北大核心
2020年第7期2054-2057,2062,共5页
Application Research of Computers
基金
中央高校基本科研业务费资助项目(JUSR51510)
江苏省研究生科研与实践创新计划项目(SJCX17_0510,SJCX18_0647)
江苏省重点研发计划资助项目(BE2019003-2)。
