期刊文献+

存储系统中两级纠错编码方案设计与验证 被引量:1

Design and verification of two-level error correction coding scheme for stoage systems
原文传递
导出
摘要 针对恶劣空间环境设计了一种两级存储编码方案,以应对航天系统中存储单元发生多个单粒子翻转(SEU)错误的问题。方案设计的主要思想是根据简单低纠错编码组合出高容错编码,通过编码组合,使用字间编码来纠正字内编码无法纠正的错误,从而使存储系统更加可靠;对两级编码方案提出若干优化策略,以提高编解码性能,使得两级冗余编码效率接近于原始字内编码。实验结果表明,提出的两级冗余编码方案能够较好解决存储系统中发生多个单粒子翻转错误的问题。即与单一的字内编码相比,两级纠错编码方案能够大大降低星上存储系统出现不可修复的概率,保证了星上存储系统的可靠运行。 This paper designs a two-level storage coding scheme for the terrible space environment to deal with the problem of multiple Single-Event Upset(SEU)errors in the storage system.The main idea of the scheme design is to combine high fault-tolerant coding according to simple error correction coding,that is,by combining coding,using inter-word coding to correct errors that cannot be corrected by intra-word coding,so that the storage system is more reliable;then a certain optimization is performed to improve the efficiency of the corresponding coding,so that the two-level coding efficiency is close to the original single-level coding.The experimental results show that the two-level error correction coding scheme can better solve the problem of multiple SEU errors.Compared with the single level coding,the probability of irreparable is greatly reduced,thus ensuring the reliability of the storage system in the space environment.
作者 罗金飞 赵帅兵 覃落雨 王刚 刘晓光 LUO Jinfei;ZHAO Shuaibing;QIN Luoyu;WANG Gang;LIU Xiaoguang(The Key Laboratory of Network and Data Security Technology of Tianjin,College of Computer Science,Nankai University,Tianjin 300350,China;China Academy of Space Technology,Beijing 100086,China)
出处 《航空学报》 EI CAS CSCD 北大核心 2019年第12期183-192,共10页 Acta Aeronautica et Astronautica Sinica
基金 国家自然科学基金(61872201,61702521,61602266,U1833114) 天津市自然科学基金(17JCYBJC15300,16JCYBJC41900) 天津市人工智能重大专项(18ZXZNGX00140,18ZXZNGX00200) 中央高校基本科研业务费~~
关键词 纠错编码 两级系统 存储系统 存储可靠性 单粒子翻转 error correction coding two-level system storage system storage reliability single-event upset
  • 相关文献

参考文献1

二级参考文献14

  • 1杨兆铭.单粒子效应对航天器的威胁及空间飞行试验评论(一)[J].真空与低温,1995,1(1):46-58. 被引量:6
  • 2薛玉雄,曹州.IDT6116单粒子敏感性评估试验研究[J].原子能科学技术,2001,21(3):266-273.
  • 3刘刚,曹州.宇航用电子元器件单粒子辐照技术[C]//第十届全国抗辐射电子学与电磁脉冲学术年会论文集.抗辐射电子学与电磁脉冲专业委员会,沈阳:抗辐射电子学与电磁脉冲学会,2009:214-216.
  • 4BARAK J, REED R A, LABEL K A. Approaches to proton single event rate calculations[J]. IEEE Trans Nuel Sci, 1996, 43(2): 496-504.
  • 5CONNELL M. Modeling the heavy ion upset cross section[J]. IEEE Trans Nucl Sci, 1995, 42(2): 73-82.
  • 6BARAK J, REED R A, LABEL K A. On the figure of merit model for SEU rate caleulations[J]. IEEE Trans Nucl Sei, 1999, 44(6): 1504-1510.
  • 7DUSSAULT H. Numerical simulation of heavy ion charge generation and collection dynamics[J]. IEEE Trans Nucl Sci, 1993, 40(6) : 1926-1934.
  • 8PETERSON E L. The SEU figure of merit and proton upset rate calculations[J]. IEEE Trans Nuel Sci, 1998, 45(6): 2550-2562.
  • 9PETERSON E L, LANGWORTHY J B, DIEHL S E. Suggested single event upset figure of merit[J]. IEEE Trans Nucl Sci, 1983, 30(6): 4533-4539.
  • 10BINDER D. Analytic SEU rate calculation compared to space data[J]. IEEE Trans Nucl Sci, 1988, 35 (6):1570-1572.

共引文献2

同被引文献1

引证文献1

二级引证文献4

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部