摘要
为避免NAND Flash存在的多位错误缺陷对二次设备搭载的ROTS的运行造成影响,提出了一种适用于ROTS场景下的ECC校验算法。结合二次设备存储和处理的数据种类多、数据量大的特点,移植了YAFFS2文件管理系统对数据进行管理,提高了存储介质的寿命和可靠性;基于YAFFS2系统和传统的BCH纠错码,优化设计了BCH的编译码模块,确保多位错误的准确检错和纠错。试验结果表明,基于YAFFS2文件管理系统的ECC纠错算法不仅可实现对错误位的检测和纠正,还能保证数据读取速率的降幅不超过1%,可满足ROTS场景下的使用需求。
To avoid the impact of multi bit error defects in NAND Flash on the operation of ROTS on secondary devices,this paper proposes an ECC verification algorithm suitable for ROTS scenarios.Combining the characteristics of multiple types and large amounts of data stored and processed by secondary devices,the YAFFS2 file management system was transplanted to manage the data,improving the lifespan and reliability of the storage medium;based on the YAFFS2 system and traditional BCH error correction codes,the BCH encoding and decoding module has been optimized to ensure accurate error detection and correction of multi bit errors.The experimental results show that the ECC error correction algorithm based on YAFFS2 file management system can not only detect and correct error bits,but also ensure that the data reading rate does not decrease by more than 1%,which can meet the usage requirements in ROTS scenarios.
作者
肖平
俞伟国
王承恩
祝鹏
段俊欢
XIAO Ping;YU Weiguo;WANG Cheng′en;ZHU Peng;DUAN Junhuan(CYG SUNRI Co.,Ltd.,Shenzhen 518000,China)
出处
《电工技术》
2025年第22期276-279,共4页
Electric Engineering
