摘要
所有的红外焦平面阵列必须进行非均匀性校正。两点线性校正法是最先开发研究的方法之一,也是使用最广泛的校正方法。然而由于响应率的非线性和噪声等原因两点线性校正后仍然存在误差。本文分析并计算了两点线性校正误差,并指出了减少非均匀校正误差的方法。
All infrared focal plane arrays (IRFPAs) require nonuniformity correction. Two-point linear correction is one of the earlier studied and widely used methods. However, nonlinearity of the responsibility and noise result in the nonuniformity error. This paper describes and calculates the error resulted from noise and nonlinearity. A method to reduce the nonuniformity error is also presented.
出处
《光电子技术》
CAS
2002年第3期164-167,共4页
Optoelectronic Technology
关键词
红外焦平面
非均匀校正
两点线性校正法
误差
infrared focal plane, nonuniformity correction, tow-point linear correction, error
