摘要
电子设备的高低温试验是电子设备生产定型的依据之一 ,在实际应用中单纯的高低温试验并不能完全体现出电子设备对环境温度的适应性 ,因此必须进行整个环境温度的适应性试验。本文根据电子设备环境温度试验中出现的问题 ,提出了电子设备环境温度试验的方法 。
High and low temperature test is one of the foundations of electronic equipment customization. Simple high and low temperature test cannot reflect the electronic equipment adaptability for ambient temperature. Adaptability test of ambient temperature must be done. The test method of electronic equipment ambient temperature is proposed on the basis of trouble in the electronic equipment test in this paper. This method can be applied to the maintenance of electronic equipment similarly.
出处
《电子测量与仪器学报》
CSCD
2002年第3期47-51,共5页
Journal of Electronic Measurement and Instrumentation
关键词
试验方法
电子设备
环境温度
工作温度
失效温度
Electronic equipment, ambient temperature, working temperature, failure temperature.
