摘要
为了了解＋ ＧＺ 重复暴露后大鼠脑组织一氧化氮合成酶（ＮＯＳ）基因表达的变化，探讨＋ ＧＺ引起脑损害的分子机制，本文用建立的定量反转录聚合酶链反应（ＲＴ－ＰＣＲ）检测方法检测＋ ＧＺ 重复暴露后大鼠脑组织内ＮＯＳｍ ＲＮＡ 表达的变化。结果＋ ＧＺ 重复暴露后 ３０ ｍ ｉｎ 和 ６ ｈ 大鼠脑组织ＮＯＳｍ ＲＮＡ明显升高，但 ２４ ｈ 时恢复正常，表明＋ ＧＺ 重复暴露可刺激大鼠脑组织 ＮＯＳｍ ＲＮＡ 的表达，ＮＯ可能参与了＋ ＧＺ 所致脑损害的病理过程，但这种损害是可逆的。
To explore the molecular mechanism of repeated +G Z exposures induced brain damage, the mRNA expression level of nitric oxide synthase (NOS) in rat brains removed 30 min, 6 h and 24 h after repeated +G Z exposure was measured by quantitative reverse transcription polymerase chain reaction (RT PCR).The results showed the NOS mRNA expression level in rat brain of 30 min and 6h after repeated +G Z exposures obviously increased, but returned to the normal level in 24h. It is suggested that the NOS mRNA expression in rat brain was stimulated by repeated +G Z exposures and NO may play a role in the pathologic course of +G Z exposures induced brain damage, but the damage is reversiable.
出处
《空军总医院学报》
1998年第1期8-11,共4页
Journal of General Hospital of Air Force,PLA
