摘要
芯片产业化过程中,涉及到大量探针卡的应用,探针卡对芯片测试非常重要;根据不同的标准对探针及探针卡进行分类;针对不同应用环境,分析了探针卡的选取方法;最后给出了探针卡的存放和使用相关规范,对探针卡的设计、加工及芯片的中测测试应用具有一定的参考作用。
Probe card is widely used in chip industrializalion, It is very important for the chip the probe and probe card are classified according to different standards; The selection method lvzed according to different application environmenk card are given. This paper has reference function for Finally. the design, testing： In this paper, of prohe card is ariathe relevant rules for the storage and manufacture and test of probe card.
出处
《中国集成电路》
2017年第4期58-61,75,共5页
China lntegrated Circuit
