摘要
针对MPC5668x芯片在温度功能测试、模拟功能测试和数字功能测试3大功能测试流程中出现的温度漂移、接触电阻和时序问题,分别采用自动触发测试机的温度调节功能、减少并修正接触电阻和建立两套时序系统的解决方法对测试程序进行优化,提高芯片良品率。研究表明:该测试方案可用于MPC5668x系列芯片及其他汽车功能芯片测试中。
The tests of MPC5668x chip consist of temperature functional test, simulation functional test and digital func- tional test, in which the temperature drift, contact resistance and timing problems are to be solved. The test programs are op- timized to improve the chip yield according to the following method, automatically trigger the temperature adjustment func- tion of the test machine, reduce and modify the contact resistance and establish two sets of timing system solutions. The test solution can be used in MPC5668x series chips and other automotive functional chip test.
出处
《天津职业技术师范大学学报》
2017年第1期23-27,共5页
Journal of Tianjin University of Technology and Education
基金
国家自然科学基金资助项目(61505146)
教育部留学回国人员科研启动基金资助项目(第48批)
天津职业技术师范大学科研发展基金资助项目(KJY1301)
