摘要
传统的化学分析方法对高品质硅石矿(含量w≥96%)中的二氧化硅难以准确测定,使用电感耦合等离子体发射光谱法(ICP-AES)可对硅石中Al_2O_3等10种杂质元素进行准确测定,结合样品烧失减量,利用差减法即可准确计算出硅石矿中二氧化硅的精确含量。该方法检测范围在0.00002%~10%,检出限下线为0.0004μg/m L^0.051μg/m L,精密度为0.82%~4.39%,准确度高相对误差小于4.17%。
The CO2 （W ≥ 96% ） in high grade silica ore can＇t be determined accurately with the traditional chemical analysis method. 10 impurities of A1203, etc, in silica ore can be determined accurately with ICP-AES method. The precise SiO2 in silica ore can be calculated accurately with difference reduction method, in combination with sample ignition loss. The detection range of method 0. 00002% -10% , lower detection limit 0. 00004μg/ mL-0. 051μg/mL, precision 0. 82%-4. 39% , accuracy high, relative error less than 4.17%.
出处
《云南地质》
2016年第2期273-277,共5页
Yunnan Geology
关键词
ICP-AES法
差减法
样品前期处理
ICP-AES Method
Difference Reduction Method
Preprocessing of Sample
