摘要
本文提出利用单层介质材料的光谱透射率曲线,在微机上用最优化方法直接求解n(λ)和d的方法,它比椭偏法具有更好的精度(n分辨到0.001,d分辨到1A),速度更快,n(λ)值可作为膜系计算和分析的依据。
For evaluating n(λ) and d values of a transparent optical thin film, this paper presents a microcomputer-based optimal method by making use of the spectral transmittance curve of single film dielectric material. As compared with the elliptical polarization method, this faster method is also better in its accuracy, with a n value up to 0.001 and a d value up to 1 A. The n(λ) value may serve as a basis for the computation and analysis of a film system.
出处
《华侨大学学报（自然科学版）》
CAS
1989年第3期274-277,共4页
Journal of Huaqiao University(Natural Science)
关键词
光学薄膜元件
透射率
微机
optical thin film elements
transmittance
optimization methods
