期刊文献+

偏光干涉在物体几何形貌检测中的应用 被引量:4

Application of Conoscopic Interference in Geometric Profilometry
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摘要 提出了一种应用晶体光学原理的新型物体几何形貌检测方法 ,介绍了新方法涉及到的晶体偏光干涉的原理 ,以及基于这个原理的形貌信号检测方法 ,并通过实验得到新方法的测量精度约为 5 μm ,测量范围约为 7mm 。 A new method that make use of the theory and techniques of crystal optics for geometric profilometry is presented. The theory of the conoscopic interference of crystal optics related with the new method is introduced, and the application of the new method in geometric profilometry is studied and some experimental results are given.
出处 《光学学报》 EI CAS CSCD 北大核心 2002年第4期452-455,共4页 Acta Optica Sinica
基金 国家自然科学基金 (5 0 0 75 0 6 4 )资助课题
关键词 偏光干涉 光学非接触测量 晶体光学 物体几何形貌检测 birefringence of anisotropic crystals conoscopic interference no contact measuring
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参考文献4

  • 1Zhang Wenwei. A Study on Profilometry of Inner Surface by Using Non-contact Measuring Method(内外表面尺寸形貌的激光非接触测量法研究).(Ph.D dissertaction]. Tianjin: Tianjin University, 1998. 1-20 (in Chinese)
  • 2Zhang Guoxiong. Coordinate Measuring Machines (三坐标测量机). Tianjin: The Publishing House of Tianjin University, 2000. 82-136
  • 3Jin Siqi. The Crystal Optic (晶体光学).Beijing:Science Press, 1995.50-51
  • 4Sirat G,Paz F.Conoscopic probes are set to transform industrial metrology. Sensor Review, 1998, 18(2) : 108-110

同被引文献31

  • 1格恩瑟AH 利本伯DH.光学干涉图的处理与判读[M].北京:机械工业出版社,1986.1-9.
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  • 3张国雄.三坐标测量机[M].天津:天津大学出版社,2000..
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  • 5Tso Yee Fan, C. E. Huang, B. Q. Huet al.. Second harmonic generation and accurate index of refraction measurements in flux-grown KTiOPO4[J]. Appl. OPt., 1987, 26(12). 2390-2394.
  • 6K. Kato. Parametric oscillation at ,3.2 μm in KTP pumped at 1.064 μm[J]. IEEE J. Quantum Electron. , 1991, 27 (5):1137-1140.
  • 7Kazuo Yamazaki, Kee Sein Lee, Hideki Aoyama at al..Noncontact probe for continuous measurement of surface inclination and position using dynamic irradiation of the light beam [J]. CIRP Annals Manufacturing Technology, 1993,42(1) :585~588.
  • 8ZhangG. X., Xu Y. C., Xie Z. X. et al.. A system for measuring high-reflective sculptured surfaces using optical noncontact probe [J] CIRP Annals Manufacturing Technology, 2001, 50( 1 ) : 483 ~ 486.
  • 9T. Wilson. Confocal Microscopy [M]. UK London: Academic Press, 1990.
  • 10H. J. Jordan, M. Wegner, H. Tiziani. High accuratecharacterization of engineering surfaces using confocal microscopy [J]. Measurement Science and Technology, 1998, 9(7) :1142~1151.

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