摘要
研究了能量为E=160keV质子和电子单独及综合辐照作用对两种空间反射镜光学表面的影响。观察到在辐照剂量达到Φ=10×105/cm2后反射镜表面形咸了明显的结构缺陷,并导致某些谱段反射率的降低和成像质量的下降。辐照诱发缺陷的类型及分布特征除与粒子种类和反射镜结构有关外,还依赖于试样的接地方式。质子幅照主要引起反射镜表面膜层的起泡现象;电子辐照则使SiO2保护膜着色;综合辐照的影响复杂,尤其是在接近于空间使用条件的第二种接地方式下,起泡现象和静电效应成为镜面损伤的主要机制。
This Paper presents the effects of 160-keV protons and electrons on the optical surfaces of two types of reflective mirrors when they are exposed to protons and electrons separately and simultaneously. It was noticed that the surfaces of reflective mirrors acquired apparent structural defects after a fluence of Φ = 6 × 1015 /cm2 . This phenomenon caused a decrease in reflectance in some wavelength regions and a degradation of photographing quality. The types and the distribution of the defects caused by radiation are related not only to the type of radiations and the structure of reflective mirrors, but also to the ground connection means. Blisters were observed on the films of reflective mirrors when exposure to proton radiation, the protection layer SiO2 acquired a pronounced color when exposure to electron radiation. But the effect of simultaneous radiation was complex,especially by the second ground connection means similar to the real space. In this case, the effect of static electricity became the primary damage mechanism.
出处
《航天返回与遥感》
2002年第1期13-17,共5页
Spacecraft Recovery & Remote Sensing
