摘要
描述了新建的2 52 Cf源模拟空间单粒子效应辐照在线测量系统 。
A new 252 Cf irradiation and measurement system for simulating single event effect has been developed. The experimental results for power MOS transistors and SRAMs are presented.
出处
《核技术》
CAS
CSCD
北大核心
2002年第4期247-252,共6页
Nuclear Techniques