摘要
当特征X射线能量较小时,吸收曲线在薄层范围内斜率很大。利用这一特点来测定薄层吸收体的厚度具有很高的灵敏度。文章阐述了这一方法的原理、计算方法和实验技术。实验数据证实了有关理论分析的正确性和可行性。
For lower energy characteristic X-ray, the slope of absorption curve is much larger In the range of thin-layer. By making use of this advantage: the thickness of a thin-layer absorber can be gauged with a high sensitivity.The principle of the method and the experimental results are described. The correctness and the feasibility of the method have be verified in this work.
出处
《核技术》
CAS
CSCD
北大核心
1989年第10期580-586,共7页
Nuclear Techniques
关键词
厚度测量
薄层
X射线
荧光吸收法
Thin-layer thickness gauging X-ray fluorescence absorption method
