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晶化前后有源层的刻蚀对poly-Si TFT性能的影响 被引量:1

Influence of lithography before or after crystallization of active layer on the properties of poly-Si TFT
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摘要 在普通玻璃衬底上低温 ( 6 0 0℃以下 )制备 poly SiTFT有源矩阵液晶显示器是当前的研究热点。采用金属诱导横向晶化法低温研制了 poly SiTFT。分析了晶化前后有源层的刻蚀对poly SiTFT性能的影响。 Preparation of poly-Si TFT active matrix liquid crystal display at low temperature(<600℃) on the common glass substrates has recently become one of the hot spots. Poly-Si TFT was fabricated at low temperature by metal induced lateral crystallization. The influence of lithography before or after crystallization of activelayer on the properties of poly-Si TFT was analyzed.
出处 《微细加工技术》 2001年第2期49-52,共4页 Microfabrication Technology
关键词 金属诱导横向晶化 有源层 刻蚀 多晶硅薄膜晶体管 metal induced lateral crystallization active layer lithography poly-Si TFT.
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  • 1WILLIAM G HAWKINS. Polycrystalline-Silicon Device Technolgy for Large-Area Electronics[J].IEEE Trans on Electron Devices, 1986,4:477-481.
  • 2JAMES SIM, ROBERT S SPOSILI. Crystalline Si Films for lntegrated Active-Matrix Liquid-Crystal Displays[J].Mat Res Soc Bull,1996,3:39-48.
  • 3Dong Kyun Sohn, Jeong No Lee, Sang Won Kang, et al. Low-Temperature Crystallization of Amorphous Si Films by Metal Adsorption and Diffusion[J].Jpn J Appl Phys, 1996,2B:1005-1009.
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  • 5Rao R, Xu Chongyang, Zou Xuecheng, et al. Aluminum lnduced Lateral Crystallization of Amorphous Silicon Thin Films[J].SPIE,2000,4077:542-544.

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