摘要
正确地识别X荧光能谱中各种谱峰的性质是进行准确定性和定量分析的前提 ,本文阐述了能量刻度的方法、元素谱峰的重迭干扰及伪峰的识别等问题。
Resolving correctly the peaks in x rays fluorescence energy spectrum is presupposition of qualitative analysis and quantitative analysis.In this paper the method of calibrating energy,interference of peak overlap and discrimination of false peak were presented and discussed
出处
《冶金分析》
CAS
CSCD
北大核心
2001年第1期49-51,共3页
Metallurgical Analysis
