摘要
目的 :研究高温状态时下丘脑延迟整流钾通道特性的改变 ,探讨高温条件下出现热损伤的作用机制。方法 :对急性分离的新生SD大鼠下丘脑细胞进行高温处理 ,采用细胞贴附式和内面向外式膜片钳记录方法 ,观察通道活动改变情况。结果 :细胞经 4 3℃处理 4 0min后 ,K+通道活动阳性率下降到 38% (n =16 ) ,而对照组 (37℃ )为 86 % (n =36 ,P <0 .0 5) ;4 3℃高温处理6 0min后 ,细胞K+通道活动阳性率下降到 <10 % (n =35) ,而对照组为 78% (n =18,P <0 .0 5) ,并且通道活动呈现多种形式。结论
Objective:To explore the changes in properties of delayed rectifier potassium channels in hypothalamic neurons when exposed to high temperature and the mechanism of heat injury.Methods:After the acutely isolated hypothalamic neurons from newborn SD rats were exposed to high temperature for certain periods, changes of channel activity through cell-attached and inside-out patch-clamp techniques were recorded.Results: After exposure to 43 ℃ for 40 min, the positive rate of channel activity in neurons decreased to 38%(n=16),while that of control(37 ℃,40 min) was 86%(n=36,P<0.05);After exposure to 43 ℃ for 60 min,the positive rate of channel activity in neurons was less than 10%(n=18),while that of control was 78%(n=35,P<0.05),and the types of channel activity became multiple. Conclusion:High temperature may alter the properties of channels by destroying channel proteins.
出处
《解放军预防医学杂志》
CAS
北大核心
2001年第1期5-7,共3页
Journal of Preventive Medicine of Chinese People's Liberation Army
基金
国家自然科学基金项目! (No.39970 810 )
军队科研基金项目! (No .98M0 71)
关键词
热损伤
下丘脑
延迟整流钾通道
钾通道
heat injury, hypothalamus, delayed rectifier potassium channel
