摘要
目的：观察膜环境高温对下丘脑神经元延迟整流性Ｋ＋通道（Ｉｋ）电压依赖性的影响。方法：采用细胞贴附式的膜片钳技术。结果：高温可影响通道的电压依赖性，使电压依赖曲线发生正向移位，过高温度则使电压依赖性减弱甚或丧失。结论：Ｉｋ电压依赖性的变化可能参与机体的发热和中暑发病过程。
AIM:To observe the effects of high temperature on voltage - dependence of delayed rectifier K+ channel (Ik) in hypothalamus neurons. METHODS: The date recording from cell - attached patches of patch - clamp technique. RESULTS: With temperature raising, shift of voltage dependence may be mediated at different degree, while higher temperature might weaken and depressed. CONCLUSION: Shift of voltage dependence likely contribut- ed to the body fever and heatstroke.
出处
《中国病理生理杂志》
CAS
CSCD
北大核心
2000年第5期440-442,共3页
Chinese Journal of Pathophysiology
基金
国家自然科学基金(No.39970810)
军队基金(No.98M071)资助
