摘要
文章报道了自行研制的多次全反射X射线荧光分析装置，着重介绍了分析装置光路系统的设计、组件、调试以及能谱分析系统，并对装置的性能测试结果进行了分析。实验结果表明，该装置的探测下限可达0．1 ng，样品分析的RSD为5％～16％，利用该装置对某核设施周边的大气样品进行了分析，结果令人满意。
A high sensitivemultiple total reflection X-ray fluorescence spectrometerwas developed,the design, components and debugging of optics system and spectrum analysis system are focused on in this article,in addition,the results of performance tests are analyzed. The results show that the MDL of instrumentcan reach 0. 1ng and the RSD( n = 6) is 5% ~ 16%. The TXRF has been applied to analysis the airborne particulate matteraroundcertainnuclear facilities,the result was satisfactory.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2013年第12期1494-1497,1542,共5页
Nuclear Electronics & Detection Technology
关键词
多次全反射
荧光仪
分析
装置研制
Multiple Total Reflection
Fluorescence Spectrometer
analysis
instrument development
