摘要
在片上系统芯片(System-on-Chip,SoC)测试优化技术的研究中,测试时间和测试功耗是相互影响相互制约的两个因素.在基于测试访问机制(Test Access Mechanism,TAM)分组策略的基础上,以测试时间和测试功耗为目标建立了联合优化模型,运用多目标遗传算法对模型进行求解.以ITC’02标准电路中的p93791电路为实例进行验证,表明此方法能够在测试时间和测试功耗的优化上获得较理想的解,且能提高TAM通道的利用率.
In the study of System-on-Chip （SoC） test optimization technology, test time and test power were mutual influence and restrict to each other. Based on TAM grouping strategy, this paper constructed the combined optimization model for test time and test power, applied multi-objective genetic algorithm to deal with the combined optimization model, and adopted ITC＇02 Benchmark circuit p93791 to verify the algorithm. The results show that it can obtain ideal solutions on optimization of test time and test power, and improve the utilization of TAM.
出处
《微电子学与计算机》
CSCD
北大核心
2013年第10期69-72,共4页
Microelectronics & Computer
基金
国家自然科学基金(60861003)
