摘要
分析了分形理论应用于低硅烧结的必要性;总结了单重分形在低硅烧结方面的应用,并指出了其中的不足;介绍了多重分形及其在多个领域的应用,重点阐述利用多重分形谱对不同R、SiO2含量、MgO含量以及配碳量的情况下的低硅烧结进行冶金分析。表明利用多重分形谱对低硅烧结矿进行研究是一种有效的研究方法。
This paper analyzes the necessity of fractal theory is applied to low silicon sinter;summarizes the single fractal application of the low silicon sinter,and pointed out the lack of;Introduction the multifractal and its application in many areas.Focuses on the use of the multifractal spectrum under different R、the content of SiO2、MgO content as well as with the amount of carbon with the low silicon sintering for metallurgical analys.Show that the multifractal spectrum to low silicon sinter study is a good way.
出处
《河北联合大学学报（自然科学版）》
CAS
2013年第3期24-26,35,共4页
Journal of Hebei Polytechnic University:Social Science Edition
基金
国家自然科学基金资助项目(No.50974052)
关键词
低硅烧结
单重分形
多重分形
low silicon sinter
single fractal
multifractal
