摘要
用化学溶液分解 (CSD)法制备 Pb(Zr0 .5 Ti0 .5 ) O3 (PZT)和 Bi2 Ti2 O7薄膜 ,利用 X-射线衍射技术研究了以 Bi2 Ti2 O7为籽晶层的 PZT薄膜的结晶性。实验结果表明 ,以高 (111)取向的 Bi2 Ti2 O7为籽晶层可获得高结晶性的 PZT薄膜 ,在 75 0°C退火 10 min的 PZT/Bi2 Ti2 O7薄膜具有单一的钙钛矿相。
The films of Pb (Zr 0 5 Ti 0 5 )O 3 (PZT) and Bi 2Ti 2 O 7 were prepared by chemical solution d ecomposition(CSD) technique in this pape r.The crystallinity of the PZT thin film s was studied by X-ray diffraction(XRD) technique,which were grown on highly(111 ) orientated seeding layer film of Bi 2T i 2O 7.The results indicate that the PZT thin films with high crystallinity can be grown on seeding layer film of Bi 2Ti 2O 7.The PZT/Bi 2Ti 2O 7 thin film anne aled at 750 °C for 10 min has the single phase of perovskite.
出处
《压电与声光》
CSCD
北大核心
2000年第5期319-321,共3页
Piezoelectrics & Acoustooptics
基金
国家"八六三"基金资助项目!(715 -0 0 2 -0 110 )
