摘要
介绍了在氦气气氛中用X射线荧光光谱仪测定液体水玻璃中二氧化硅、氧化钠、氧化钾、硫的检测方法。研究了样品的取样方式和取样量、仪器分析参数的设置、元素光谱背景的确定、光谱重叠和吸收-增强效应的校正。各组分拟合在一套工作曲线中,将基本参数法和经验系数法相结合,用以校正共存元素间的吸收-增强效应和谱线重叠影响。通过对方法的精密度和准确度的试验,确定了最佳试验条件。将该方法测定结果与化学法比对,准确度满足国家标准方法分析误差的要求。
Introduced determination methods of SiO2, Na2O, K2O, and S in sodium silicate by X-ray fluorescence spectrometry in the helium atmosphere.Studied sampling way and quantity, setting of instrumental parameters, ascertainment of element spectral background, and correction of spectral overlapping and absorption-enhancement.Each component was fitted in one working curve.The combination of the fundamental parameter method and empirical coefficient method was mainly used to correct the absorption enhancement and spectral overlapping effects of the coexisting elements.The optimum test conditions were confirmed through investigating the precision and accuracy of the determination methods.Comparing with chemical method, the accuracy of this method could meet the analysis error demand of the national standard method.
出处
《无机盐工业》
CAS
北大核心
2013年第4期56-59,共4页
Inorganic Chemicals Industry
