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HfO_2/SiO_2多层高反膜激光预处理技术 被引量:7

Laser conditioning methods for hafnia silica multilayer high-reflective coatings
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摘要 采用不同的光斑移动距离,对电子束蒸发制备的HfO2/SiO2多层高反膜进行了单步及多步预处理。结果表明:为了使薄膜不产生损伤,预处理最高能量密度最好不超过薄膜零几率损伤阈值的90%;相同预处理效率下进行的单步预处理对提高光学薄膜抗激光损伤阈值的效果比多步预处理好;对HfO2/SiO2高反膜进行98.4%能量覆盖的两步预处理后薄膜损伤阈值提高81%;控制薄膜的缺陷源,初始物质应采用金属Hf。 Single-step and multi-step laser conditioning methods for HfO2/SiO2 multilayer high-reflective (HR) coatings prepared by electron-beam evaporation were introduced, with the use of different beam increment between pulses. In order not to damage the coating, the maximum conditioning fluence can not exceed 90% of its unconditioned laser induced damage threshold (LIDT). The LIDT enhancement of the coating after single-step conditioning is more than that after multi-step conditioning under the same conditioning efficiency. After two-step laser conditioning with a beam increment between pulses equal to the beam diam- eter at 98.4% of the peak intensity, the LIDT of the coating attains 181% of that of the unconditioned coating. The starting ma terial composition for the hafnia layers has a direct impact on the concentration of defects imbedded in the coating, it is believed that coatings deposited from hafnium have defect-seeds at a significantly lower density.
作者 代福 杨李茗
出处 《强激光与粒子束》 EI CAS CSCD 北大核心 2013年第4期929-934,共6页 High Power Laser and Particle Beams
关键词 激光预处理 缺陷 能量覆盖 高反射膜 laser-conditioning defect energy overlap high-reflective coating
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参考文献14

  • 1Kozlowski M R, Wolfe C R, Staggs M C, et al. Large area laser conditioning of dielectric thin film mirrors[C]//Proc of SPIE. 1989,1438: 376-390.
  • 2Stolz C J, Sheehan L M, Maricle S M, et al. A study of laser conditioning methods of hafnia silica multilayer mirrors[C]//Proe of SPIE. 1998, 3264:105-112.
  • 3Wolfe C R, Kozlowski M R, Campbell J H, et al. Laser conditioning of optical thin films[C]//Proc of SPIE. 1989, 1438:360-375.
  • 4Fornier A, Cordillot C, Ausserre D. Laser conditioning of optical coatings: some issues in the characterization by atomic force microscopy [C]//ProcoISPIE. 1993, 2114:145- 162.
  • 5Kaiser N, Anton B, Janchen H, et al. Laser conditioning of LaF/MgF, dielectric coatings for excimer lasers[C]//Proc of SPIE. 1994, 2428:400-409.
  • 6Stolz C J, Sheehan L M, Maricle S M, et al. A study of laser conditioning methods of hafnia silica multilayer mirrors[C]//Proc of SPIE. 1998, 3578:1-9.
  • 7Rainer F, De Marco F P, Hunt J T, et al. High threshold HR coatings at 1064 nm[C]//Proc of SPIE. 1990, 1441:1-8.
  • 8Sheehan L, Kozlowski M R, Rainer F, et al. Large area conditioning of optics for high-power laser systems[C]//Proc of SPIE. 1993, 2114: 559-568.
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二级参考文献10

  • 1Kozlowski M R, Wolfe C R, Staggs M C, et al. Large area laser conditioning of dielectric thin film mirrors[C]//Proc of SPIE. 1989, 1438: 376-390.
  • 2Stolz C J, Sheehan L M, Maricle S M, et al. Laser conditioning methods of hafnia silica muhilayer mirrors[C]//Proc of SPIE. 1998, 3264:105-112.
  • 3Wolfe C R, Kozlowski M R, Campbell J H, et al. Laser conditioning of optical thin films[C]//Proc of SPIE. 1989, 1438:360-375.
  • 4Fornier A, Cordillot C, Ausserre D. Laser conditioning of optical coatings: some issues in the characterization by atomic force microscopy [C]//ProcofSPIE. 1993, 2114:145-162.
  • 5Kaiser N, Anton B, Janchen H, et al. Laser conditioning of LaF/MgF, dielectric coatings for excimer lasers[C]//Proc of SPIE. 1994, 2428 :400 -409.
  • 6Stolz C J, Sheehan L M, Maricle S M, et al. A study of laser conditioning methods of hafnia silica mu[tilayer mirrors[C]//Proc of SHE. 1998, 3578:1-9.
  • 7Rainer F, De Marco F P, Hunt J T, et al. High threshold HR coatings at 1 064 nm[C]//Proc of SPIE. 1990, 1441:1-8.
  • 8Sheehan L, Kozlowski M, Rainer F, et al. Large area conditioning of optics for high-power laser systems[C]//Proc of SPIE. 1993, 2114: 559-568.
  • 9赵强,裘弘,刘晔,范正修,王之江.光学薄膜的小光斑扫描激光预处理研究[J].光学学报,1999,19(8):1105-1109. 被引量:3
  • 10胡建平,马平,许乔.用1064nm激光增强HfO_2/SiO_2薄膜的抗激光损伤能力的实验研究[J].强激光与粒子束,2003,15(11):1053-1056. 被引量:12

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