摘要
液晶空盒盒厚决定了液晶盒中液晶层的厚度 ,对整个液晶显示器件的光电特性、底色及响应速度等有很大的影响。因此 ,如何准确地测量空盒盒厚具有实际的应用价值 ;本文从光干涉原理出发 ,推导出测量液晶空盒盒厚的简单而准确的方法 ,此方法适用于各种排列及任意扭曲角的液晶空盒 ,具有误差小、设备简单、操作简便等特点 ,充分满足了液晶显示器件生产厂家进行盒厚过程监控和优化器件设计的需要。
The liquid crystal hollow cell gap decides the gap of liquid crystal layer in one liquid crystal cell and has an important effect on the display quality such as the characteristic of photoelectricity , the color of background and the responding speed. Hence, measuring of the liquid crystal hollow cell gap have an important significance in practice. In this paper , the spectral interferometric principle is used to deduce the method for measurement of the liquid crystal hollow cell gap , which is fit to every kinds of liquid crystal hollow cell gap and is practical , simple and accurate , reaching the necessity of the manufacture in controlling the fabrication processes and designing processes to achieve high-quality display.
出处
《仪表技术与传感器》
CSCD
北大核心
2000年第7期24-26,共3页
Instrument Technique and Sensor
关键词
液晶空盒盒厚测量
垫隔粉
光干涉原理
Spectral Interferometry,Liquid Crystal Hollow Cell Gap, Spacer Particle
