摘要
介绍了一种应用数字图象处理分析纳米晶粒尺寸的方法．给出了实现这一方法的步骤．应用它对镶嵌在ＳｉＯ_２薄膜中的ＧａＡｓ纳米颗粒进行统计分析，结果具有较好的可信度，表明该方法具有一定的实用性．
in this paper is introduces a new method for using digital image processing todetermine the size distribution of nanocystalline grains, with steps for its realization discussed in details. This method, when applied to statistical analysis on the size of GaAsparticles embedded in SiO2 thin films is relatively satisfactory, which shows that the system is good for practical use.
出处
《汕头大学学报（自然科学版）》
1999年第2期7-9,共3页
Journal of Shantou University：Natural Science Edition
