摘要
针对反熔丝FPGA电路,在"强光一号"加速器上进行了瞬时电离辐射试验,发现γ射线瞬时电离辐射会导致FPGA内部寄存器清零,使FPGA运行状态被初始化。为了解决该问题,设计了一种"FPGA+FRAM(铁电存储器)+特殊时序读写软件"的加固电路,通过γ射线瞬时电离辐射试验证明:该加固电路实现了瞬时电离辐射状态下FPGA内部重要数据的实时保存与恢复,成功规避了FPGA电路的瞬时电离辐射效应。
The γ transient Ionizing radiation effects of Antifuse- based FPGA Circuit were investgated using ＂Qiangguang - I ＂ accelerator. It was detected that γ transient Ionizing radiation result in FPGA registers were reset. So, in order to resolve the problem, the especial hardened antifuse - based FPGA circuit was designed, that comprises FPGA, FRAM and especial read - write soft . The transient Ionizing radiation experiment data proved that the design was successful in achieving the FPGA information saving and resume , avoiding γ transient radiation effects.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2012年第11期1247-1250,共4页
Nuclear Electronics & Detection Technology
