摘要
本文介绍了与电化学C-V测量相结合的光压谱技术的基本原理、实验装置及其在研究化合物半导体材料方面的应用。
The principle and cxperimentat equipment for the technique of PVS associated with electrochemcal C-V measurement are introduced in the present paper along with the application in research on comPound semiconductor ma- terials.
出处
《半导体光电》
CAS
CSCD
北大核心
1991年第3期289-293,共5页
Semiconductor Optoelectronics
