摘要
介绍了硅漂移(SDD)探测器在X荧光分析系统中的应用,与SI-PIN探测器在能量分辨率、计数率等性能指标上的对比,以及在系统检出限上的实验对比,SDD探测器在性能指标及检出限上有着较大的优势。
In this paper,the application of silicon drift detector(SDD) in the X-ray fluorescence(XRF) analysis system was mostly discussed.Compared with SI-PIN detector at the key performance parameter like energy resolution and count rates,and also on the detection limit,the SDD detector had a larger advantage.
出处
《大众科技》
2012年第12期96-97,共2页
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