摘要
为实现快速、无损、精确的塑料薄膜厚度分析,讨论了XRF方法在塑料薄膜厚度测量中的应用,采用源初级射线散射法对塑料薄膜厚度进行相对测量。结果表明,厚度在10～800μm时,反散射X射线荧光强度与塑料薄膜厚度线性关系良好。对仪器标定后进行200 s快速测量,测量的厚度绝对误差<3μm(10～135μm),相对误差<4%(36～576μm),有较高的测量精度。XRF方法可用于塑料薄膜厚度的测量,该法对塑料工业的生产有现场指导的意义。
The application of X - ray fluorescence analysis instrument to measuring the thickness of plastic film was presented. The dispersion of radial was used to find a way to measure the thickness of plastic film quickly, lossless and exactly. The result proved that the intension of XRF has a good linearity with the thickness of plastic film during 10 - 800μm. After demarcating the instrument, we did a 200 s＇ test, which shows that the absolute error less than 3 μm during 10 - 135 μm, and the comparative error less than 4% during 36 -576μm, which means the precision is good. The X -ray fluorescence analysis instrument can be used in measuring the thickness of plastic film, and the technique has a locale supervising significance of plastic industry.
出处
《广东微量元素科学》
CAS
2012年第8期62-66,共5页
Trace Elements Science
基金
"863计划"海洋领域项目(2006AA09Z219)
"863计划"项目:高精度能谱探测仪器研发(2012AA061803)
关键词
X射线荧光
散射射线
塑料薄膜
厚度测量
快速测量
XRF analysis method
dispersion quick measure of radial
plastic film
measure of thickness
quick measure
