摘要
为提高HgI2晶体气相定向生长效果,在ITO导电玻璃上从DSMO-HgI2-H2O溶液中过饱和析出HgI2外延衬底,进而在外延衬底上气相沉积HgI2多晶薄膜并制备了相应的探测器。利用SEM、XRD分析了薄膜的定向生长特性;以241Am为放射源,在室温下测试了探测器的探测效率。
In order to improve the orientated growth of HgI2 films in vapor, iso - epitaxy layers of poly- crystalline mercuric iodide were deposited on ITO conductive glass by DSMO -HgI2 -H2O solvent evapo- ration, polycrystalline HgI2 films were then grown on iso - epitaxy layers by PVD. The films grew were investigated by SEM and XRD. The polycrystalline HgI2 films detectors fabricated was studied by an un- collimated 241Am radiative source with the principal energy of 59.5keV at room temperature.
出处
《功能材料与器件学报》
CAS
CSCD
北大核心
2012年第5期426-430,共5页
Journal of Functional Materials and Devices
基金
西安工业大学凝固理论与功能材料科研创新团队基金
西北工业大学基础研究基金(JC20110244)
关键词
碘化汞
多晶薄膜
同质外延
定向生长
探测器
mercuric iodide
polycrystalline films
iso - epitaxy
orientated growth
detectors