摘要
对比度灵敏度是描述计算机断层成像(CT)系统分辨图像细节特征能力的参数,其主要受图像统计噪声水平的影响。本文介绍了CT对比度灵敏度的测量方法,并用直径50mm的均匀有机玻璃圆柱作样品测量225kV-3D-ICT系统的对比度灵敏度,在X光机电压为160kV的条件下,得出在0.3mm×0.3mm×0.3mm范围内的对比度灵敏度约为1%。并讨论了系统的稳定性、硬化校正和重建滤波参数对测量结果的影响。
Contrast sensitivity describes the ability of the micro-CT system to reproduce object composition,which mainly depends on the noise of the image.The method of measuring the contrast sensitivity was introduced.A phantom with 50 mm diameter was measured on the system 225 kV-3D-micro ICT and it is found the contrast sensitivity is about 1% at the range of 0.3 mm×0.3 mm×0.3 mm.In addition,the system stability,beam hardening and the reconstruction parameter which affect the measurement result were studied.
出处
《原子能科学技术》
EI
CAS
CSCD
北大核心
2012年第10期1270-1273,共4页
Atomic Energy Science and Technology
基金
高分辨率板状构件三维显微层析成像关键技术研究项目资助(1110905063)
工业CT图像硬化伪影校正方法项目资助(H95463P0U2)
高分辨板状物件CL成像设备研制项目资助(Y0292700S7)
