摘要
文章介绍了工作波段为 8～ 12 .5μm、工作温度为 80K ,器件尺寸 :长度L =70 0 μm、宽度w=6 2 .5μm、厚度d =7μm、读出区面积wl=6 2 .5μm× 50 μm(名义值 )的 8条SPRITE红外探测器制造和性能 ;描述了器件工作电压和探测器性能的关系 ;讨论了该探测器在热成像系统中最佳使用偏置应为 6 0V/cm ,而不是目前的 30V/cm ;对SPRITE探测器进行了理论分析 ,指出 :在热成像系统中 ,偏置为 6 0V/cm的SPRITE探测器将获得最佳应用 ,其性能优于 16 0元背景限线列探测器 ;还讨论了探测器的热负载和工作电压的关系。
In the paper, the eight filaments of SPRITE detector in the 8～12.5μm wave band at 77K are introduced. The parameters of the device are the length of 700μm, the width of 62.5μm, the thickness of filament of 7μm and the area of read out of 62.5μm×50μm. The manufacture and the performances of the detector are introduced. And the relationship between bias and performances of the detector is discussed. In the application of the thermal image system, the optimized operating bias for the detector is at 60V/cm, not at 30V/cm. The SPRITE detector is also analyzed at 60V/cm bias in the theory, and the optimum performance of the arrays for the thermal image system is better than 160 BLIP elements of the MCT photoconducter device. And the performance and the heat load of the detector are improved by the bias voltage of the detector which gone up from 30 to 60V/cm. \;
出处
《红外与激光工程》
EI
CSCD
2000年第4期58-61,共4页
Infrared and Laser Engineering
