摘要
光电耦合器是DC/DC电源的关键器件,光电耦合器低频噪声的随机增大是该类电源主要失效模式之一。目前,国内尚未形成光电耦合器低频噪声的有效测试方法,更未建立相关标准。文章详细分析了光电耦合器低频噪声特性及产生机理,提出了其低频噪声测试的偏置电路、测试设备和测试方法。针对用于DC/DC电源的典型光电耦合器(4N47)的实测结果表明,该方法能够准确测试光电耦合器的低频噪声,为DC/DC电源用光电耦合器的系统适用性和典型故障提供了一种有效的评估方法。
Optoelectronic coupled device（OCD） is a key element of DC/DC converter.The random increase of low frequency noise（LFN） is one of the main failure modes of DC/DC converter.Effective test method and standard for LFN of photoelectric coupler are absent in China.In this paper,characteristics of low frequency noise in OCD and its generation mechanism were investigated in detail.Bias circuit,equipment and method for LFN measurement were proposed.Experimental results from OCD 4N47 in DC/DC converter demonstrated that the proposed method could be used for accurate measurement of low frequency noise of OCDs,providing an effective approach to evaluating typical faults and system suitability of optoelectronic coupler for DC/DC converter.
出处
《微电子学》
CAS
CSCD
北大核心
2012年第5期741-744,748,共5页
Microelectronics
基金
国家重大专项宇航元器件应用验证子项(2009ZX01025-001-601A)
中央高校基本科研业务费专项(72104966)
关键词
DC/DC电源
光电耦合器
低频噪声
DC/DC converter
Optoelectronic coupled device
Low frequency noise
