摘要
随着电子器件朝着高性能、小尺寸和长寿命方向发展，传统的寿命试验可靠性评价方法的局限性日益显著。近年来得到的大量研究结果表明，对于大多数电子器件，噪声是导致器件失效的各种潜在缺陷的敏感反映，噪声检测方法以其灵敏、普适、快速和非破坏性的突出优点，正在发展成为一种新型的电子器件可靠性表征工具。本文对该领域目前的研究进展做了概括性的评述。
The conventional reliability evaluation of lifetime tests is limited with the development of electron devices toward excellent performance,small size and high reliability.It is shown from a lot of recent evidences that noise in electron devices is a sensitive measure of various reliabilitydependent defects,and hence noise measurement is expected to be a general,fast and nondestructive tool to characterize reliability in these devices.A review of recent development on the new technique is presented in this papar.
出处
《电子学报》
EI
CAS
CSCD
北大核心
1996年第2期76-82,共7页
Acta Electronica Sinica
关键词
电子器件
噪声
可靠性
缺陷
Electron device,Noise,Reliability,Defect
