摘要
对全膜绝缘介质电容器进行直流耐压试验的危害进行了理论分析和试验研究 ,结果表明全膜绝缘介质电容器进行直流耐压试验 ,无论是电压分布的机理 ,还是试验效果同交流都是不一样 ,直流耐压试验中将发生故障元件检出率低和电压分布不均匀等现象 ,并导致绝缘良好的元件击穿。
Theoretical analysis and experiment about DC voltage withstand test on power capacitors are described in this paper. The mechanism of voltage distribution and the effects on film capacitors in DC test and AC test are different. The detection efficiency is lower and the voltage distribution is nonuniform in DC test. Breakdown may be leaded. The DC voltage withstand test on film capacitors should be prohibited.
出处
《高电压技术》
EI
CAS
CSCD
北大核心
2000年第3期69-71,共3页
High Voltage Engineering
